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Technology Products & Services EZZ e-newsletter 12092023 |
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The new JumperRun enables detection and automatic analysis of end-face defects, 3D end-face interferometric testing, and IL and RL measurement! JumperRun improves efficiency up to 4 times, simplifies the measurement process and reduces repeated insertions and removals! |
Main specifications: Resolution 0.29μm, Defect detection
less than 1μm, Test time 7 seconds. Mandrel-free IRL test module! JumperRun is available as a combination of the IRL and the Future+ unit. Individual units or other Dimension products are also available to order! |
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